CMSC 2012 is now “in the books,” and it was a smashing success at a great venue in New Orleans. Every year, the conference is filled with up-close looks at the latest portable coordinate metrology technologies, unparalleled networking opportunities and social events, and fantastic white paper presentations from thought leaders in academia as well as industry. CMSC 2012 was no different.

In addition to all those great reasons to attend, this year’s conference (the 28th in our history) was particularly memorable for some critical milestones in the development of our personnel certification program within portable 3D metrology. This is the first program of its kind in industry, and at CMSC 2012, we rolled out a pilot certification exam. More than 80 attendees took the test, and the anonymous results are providing us with a wealth of invaluable information. You’ll be seeing summary reportage on these results in the coming weeks, both in this e-newsletter and on the CMSC website at www.cmsc.org.

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