(CMSC: Benbrook, TX) -- The Coordinate Metrology Society (CMS), the membership association for measurement professionals, has announced a call for papers for the 2012 Coordinate Metrology Systems Conference (CMSC). The 28th annual event will be held at The Roosevelt New Orleans in New Orleans, July 16–20, 2012. The CMSC is the only North American conference dedicated solely to users of portable, high-precision measurement technology used to inspect manufactured and assembled components on the factory floor.
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The organization welcomes abstracts for presentations and technical papers submitted by metrology professionals from manufacturers, science laboratories, and academia. Suggested topics include industry best practices, scientific research and developments, and successful applications of 3-D coordinate measurement systems. At the 2011 CMSC, 26 presentations were delivered by industry leaders and educational institutions covering technology, theory, and practice to advance the field of 3-D metrology.
Abstract submissions will be peer-reviewed by the CMS and considered for presentation at CMSC 2012.
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