(Nikon Metrology: Brighton, MI) -- Nikon Metrology has released the Mk 4 XT V platform iteration that introduces key improvements to enhance user experience and system reliability changes to increase up time. XT V is a high-precision, flat-panel based X-ray inspection system that facilitates real-time imaging and defect analysis to the highest level of detail.

The Mk 4 now offers advancements that not only include changes visually, but also incorporate a number of practical modifications to increase the system’s performance. Perhaps the biggest change is that now it is officially a Nikon-branded product, which helps to instill confidence and heritage within the system range.

XT V real-time X-ray allows users to intuitively navigate complex printed circuit boards and electronic components to quickly trace defects even on the most challenging electronic components and assemblies. The high-precision system facilitates real-time imaging and defect analysis of next-generation wafer-level, semiconductor device and PCBA applications. The system offers a number of highlights, including feature recognition, making it indispensable for any electronics development and production environment.

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