Laser trackers are widely used for metrology and precision surveys. Depending on the approach, range, and instrument itself, the measurement accuracy can vary from millimeter to micron. Several applications of laser trackers used in the National Synchrotron Light Source II (NSLS-II) project will be explained in this article to show examples of using laser trackers to achieve very high accuracy.

Introduction

The NSLS-II at Brookhaven National Laboratory is one of the newest and most advanced synchrotron facilities in the world. With state-of-the-art design and a 3 GeV, 500 milliamp electron storage ring, it will enable the study of material properties and functions with nanoscale resolution and exquisite sensitivity by providing world-leading capabilities for X-ray imaging and high-resolution energy analysis. It currently is running at 300 mA with 19 operational beam lines. There are nine more beam lines to be accomplished during fiscal year 2018.¹

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