(Marposs: Auburn Hills, MI) -- Marposs Inc., a leader in measurement, testing, and inspection equipment, is announcing the latest addition to its highly successful line of Industry 4.0 metrology solutions, the STIL Micromeasure 2 3D measuring system.

The Micromeasure 2 high-performance 3D measurement system is ideal for noncontact surface measurement, providing exceptional performance across a wide range of metrology uses, including machined parts, electronics, semiconductor, and wafer processing. Its chromatic confocal sensing technology can measure dimensional attributes, surface roughness, three-dimensional shapes and microtopography, and displacement of part features relative to datums and other features, even in challenging materials like glass and polymers.

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