(Carl Zeiss: Phoenix, AZ) -- At the 2012 Microscopy & Microanalysis conference in Phoenix, Carl Zeiss Microscopy introduced an extension of its Field Emission Scanning Electron Microscope (FE-SEM) platform MERLIN. Customers can now choose between MERLIN Compact, MERLIN VP Compact, and MERLIN and configure them individually. The plug-and-play feature allows users to add and change detectors with minimum effort to handle tasks ranging from simple image capture to extensive material analysis. A large frame store of 32K x 24K pixels allows imaging of very large areas. New features include in-situ 3D surface reconstruction and calculation of 3D data from 2D data. The new in-lens Duo detector offers both high-resolution imaging and extensive materials information. MERLIN VP Compact allows for high-resolution imaging even of nonconductive samples without coating.

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