(CENAM: Santiago de Queretaro, Mexico) -- The committee from Mexico’s national metrology center, Centro Nacional de Metrología (CENAM), invites researchers, professionals, and all personnel in the metrology field to participate Simposio Metrología, the 2010 Metrology Symposium, which takes place in the, Oct. 27–29, at the Mission Queretaro Juriquilla Hotel in Santiago de Queretaro, Mexico. The objective of this year’s symposium is metrology, productivity, and economical development. Topics will include:

• Metrology in Mexico: challenges and perspectives

• New industrial measurement methods

• Improvements and new developments for industrial metrology

• Measurement standards and systems

• Metrology in chemistry and its applications

• Metrology in bioanalysis

• Metrology in nanotechnology

• Traceability

• Uncertainty estimation in measurement

• Legal metrology

• Conformity assessment

• Metrology in scientific research

• Metrology in education

• Mathematical and statistical tools for metrology

 …