(Olympus America: Center Valley, PA) -- The study of surface roughness, which can affect everything from the way a coating adheres to a pill to the way light travels through solar panels, is one of the fastest growing areas of industrial research and development. To explore surface metrology and its varied applications, Worcester Polytechnic Institute (WPI) is hosting a three-day international conference October 26-28 at the WPI Campus Center in Worcester, Massachusetts, with support from Olympus America Inc. The conference will focus on the latest advances and insights in surface metrology fundamentals, methods, equipment, software, and applications.

The International Conference on Surface Metrology is open to engineers, scientists, technicians, and the general public interested in surface roughness and surface metrology applications. The program features extensive tutorials, exhibits, and technical sessions addressing numerous technologies, industries, and applications. In addition to engineering topics, the conference includes technical presentations on surface metrology in archeology, anthropology, and cultural preservation.  There also will be poster sessions, an opening reception, and a conference dinner for participants.

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