(Olympus America Inc.: Center Valley, PA) -- The 2nd International Conference on Surface Metrology will convene at Worcester Polytechnic Institute in Worcester, Massachusetts, from Oct. 25–27, and will again be supported by Olympus America Inc., a provider of industrial measurement and imaging instruments. The conference will focus on the latest advances in the study of surface roughness, which can affect everything from the way a coating adheres to a pill to the way light travels through solar panels. Because objects interact with one another at their surfaces, this field is one of the fastest-growing areas of industrial research and development.

The three-day conference will include the following keynote speakers and session topics:

• Mady Elias, Ph.D., of the Institute of Nanosciences of Paris, “Influence of Surface Roughness on Visual Appearance”

• Richard Leach, Ph.D., of the United Kingdom’s National Physical Laboratory,“Do We really Know How to Measure Surfaces?”

• Peter S. Ungar, Ph.D., of the University of Arkansas, “Microscopic Use-Wear on Teeth and Diets of Human Ancestors and other Fossil Mammals”

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