(AMETEK: Kleve, Germany) -- SPECTRO Analytical Instruments, a unit of AMETEK Materials Analysis Division, unveiled the updated version of its SPECTROLAB metal analyzer at the GIFA foundry trade show in Dusseldorf, Germany, held June 28–July 2, 2011. The latest version of the versatile metal analyzer incorporates a number of improvements, and in several instances achieves better detection limits than its predecessor, in  trace analysis of pure copper and aluminum, for instance.

“Since our introduction of the first SPECTROLAB equipped with a hybrid optic in 2007, we’ve seen enormous interest in this technology everywhere,” says Kay Tödter, SPECTRO’s product manager for stationary metal analyzers. “For many users, the combination of the two detector technologies opens new possibilities for improvements in laboratory analytical performance.”

“This latest SPECTROLAB offers the advantages of photomultiplier detectors relative to single-spark evaluation and time-resolved spectroscopy, along with the flexible line selection and the ability to combine analytical and reference lines from charge-coupled device detectors,” Tödter adds.

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