Hundreds of metrology professionals are expected to attend the International Metrology Interoperability Summit, March 28–30 in Gaithersburg, Maryland. The goal of the event is to define a unified “technology roadmap” for dimensional metrology system interoperability, which will form the basis for a more substantive document after the summit. The roadmap will provide a common agenda for the metrology industry as a whole, noting that component interoperability would reduce training costs, allow best-in-class component choices and provide a more competitive provider environment.

The summit will be held at the offices of the National Institute of Standards and Technology. The day before it starts, there will be a golf outing at the Musket Ridge Golf Club for those attending the conference.

For more information, visit www.isd.me1.nist.gov/IMIS2006.

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