(Nikon Metrology: Brighton, MI) -- As simple to use as a digital camera, the NeoScope II is a high-resolution scanning electron microscope (SEM) that produces images with a large depth of field at magnifications ranging from 10X–60,000X. It offers high and low vacuum operation, three selectable accelerating voltages, secondary electron, and back-scattered electron imaging. The NeoScope II accommodates samples up to 70 mm in diameter and 50 mm in thickness. The NeoScope examines both conductive and nonconductive samples without any special sample preparation. Optional EDS is available for elemental analysis.

Another new feature of the NeoScope II SEM is a touchscreen interface with the familiar look and feel of today’s smart phones and tablets. Automatic functions as well as prestored recipe files make it easy to use for a multitude of sample types. Any skill level of user will appreciate the simplicity and fast operation, from sample loading to imaging in vacuum in fewer than three minutes.

Simple operation
• Easy touchsceenl operation
• A complete range of automated functions (e.g., focus, stigmator, contrast/brightness)
• Easy, dependable auto gun alignment (filament centering)

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