(Nikon: Tokyo) -- Nikon Corp. has launched the NEXIV VMF-K Series, a video measuring system designed to meet increasing semiconductor and electronic component inspection demands. 

Building on the success of the VMZ-K Series, the NEXIV VMF-K Series offers significant benefits to a wide range of industries in addition to semiconductor manufacturing, including advanced packaging, substrate production, wafer inspection, and probe card inspection. 

As semiconductors become smaller and more integrated, inspection processes are increasingly crucial for quality assurance. The NEXIV VMF-K Series addresses this challenge by providing stable measurements of micron-level dimensions while significantly improving throughput, thereby supporting stringent quality control in semiconductor device manufacturing.  

Key benefits of the NEXIV VMF-K Series include: 

Enhanced measurement throughput: The VMF-K Series achieves 1.5 times higher measurement throughput compared to the previous VMZ-K model (according to Nikon’s standard measuring conditions), significantly reducing measurement time and boosting productivity. 

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