(Nikon Metrology: Brighton, MI) -- When using X-ray CT (computed tomography) for nondestructive quality control of larger components like aluminum castings or battery modules for electrical vehicles, the challenge is to shorten inspection cycle times without compromising resolution. One prerequisite for achieving this is high X-ray intensity or flux.

In Nikon Metrology’s range of X-ray CT systems, a rotating target can already triple the flux for a given focal spot size, and the flux can be further increased by motorized FID (focal spot to imager distance), which brings the detector closer to the source at the push of a button.

With the release of a new offset CT reconstruction algorithm in the latest version of the manufacturer’s Inspect-X software, not only can larger components be scanned but it can also be performed at higher geometric magnification. The Offset.CT module is available on all Nikon Metrology X-ray CT systems from 180kV through to 450kV.

With this unique combination of the latest Rotating.Target 2.0, adjustable FID, and Offset.CT, which cannot be found in any competitive industrial CT system, cycle times are significantly reduced, and better resolution is achieved, even when processing large and complex components.

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