(Nikon Instruments Inc.: Melville, NY) -- The new series of Nikon LSI inspection microscopes, Eclipse L200N and L200ND, is now available. Building on the high resolution and precision of the Eclipse L200 and L200D series, the L200N and L200ND offer improved observation and operating performance, providing images with greater contrast and higher resolving power. Used independently or in combination with wafer loaders, the L200 series performs exceptionally precise optical inspection of wafers, photo masks, reticules and other substrates.

 …