(Taylor Hobson: Chicago) -- Taylor Hobson, a global provider of ultra-precision measurement instrumentation, has introduced the Talysurf CCI SunStar coherence correlation interferometer that merges world-leading noncontact dimensional measurement capability with advanced thin and thick film analysis technology. The CCI SunStar was developed to specifically meet the requirements of the most demanding photovoltaic and semiconductor applications.

The CCI SunStar seamlessly integrates the latest thin-film analysis technology with dimensional and roughness measurement and analysis tools making it possible to measure film thickness from 5 µm down to 300 nm or less. From a single measurement, the CCI SunStar is able to obtain information on film thickness, interface roughness, pinhole defects, and delamination of thin-coated surfaces. Among its unique features are a four-million-pixel camera for high-resolution imaging over a large area, auto-range and auto-fringe-find for ease of use, single mode of operation over all scan ranges, and a stable and robust closed-loop Z scanning mechanism.

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