(Zemetris: Tucson, AZ) -- Zemetrics, an optical metrology product company founded last year to provide new concept surface metrology systems, has brought its first system, ZeMapper, to the precision engineering and research and development (R&D) market.

The ZeMapper interferometric optical profilometer provides 3-D surface maps with the highest lateral and vertical resolution in a user-friendly automated process. Its large image sensor of four mega-pixels combines a large field of view with high resolution, unmatched in any commercial profiler. Advanced processing of the interferometric data leads to rapid precision measurements with sub-Angstrom repeatability. Designed for ultraprecision metrology, the instrument has been beta-tested by research customers, and is now in production.

ZeMapper is expected to fill unmet needs in surface mapping among users that need nondestructive, noncontact areal measurements with high resolution and repeatability in applications such as defect review, surface characterization and volume displacement for data storage, optics, MEMS, tribology, material, and biological sciences.

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