(Nikon Metrology: Brighton, MI) -- Nikon Metrology has announced that Alex Lucas, the company’s business development manager for scanning products, will be presenting the Xtreme Scanning Innovation Brief at the Quality Expo Show in Chicago. This event will occur on Wednesday, Sept. 21, 2011, from 2:45 p.m.–3:05 p.m. at Nikon Metrology’s booth (booth location to be announced).

During the past few decades, laser scanners have grown from a novelty research topic to a critical component of the design process. Now they are essential to scores of manufacturers’ rapid inspection needs. Nikon Metrology offers a host of scanners that collect point-cloud data at blistering rates. Real-life examples of how productivity has increased and costs reduced will be discussed during the briefing.

This presentation will cover:
• Latest advancements in coordinate measuring machines (CMMs) and handheld scanners
• Advantages of laser scanners, and typical applications
• Nikon Metrology’s product portfolios
• Video demonstration of Nikon’s Focus Inspection software

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