(ZEISS: Maple Grove, MN) -- The NEX series of instruments from ZEISS Industrial Metrology integrate additional measurement analysis with new detectors. SURFCOM NEX 100 offers a single hybrid detector to measure surface texture and contour at the same time. RONDCOM NEX Rs offers best-in-class spindle accuracy and allows optional surface roughness measurements in the horizontal, vertical, and radial axes.

Pair your preferred surface texture and contour detectors with SURFCOM NEX 100

SURFCOM NEX 100 offers the highest accuracy in its class for roughness and contour measurements. Its ability to analyze roughness and contour in one run enhances measuring efficiency. Choose from multiple contour and roughness sensors to fit your application. The high-speed and low-vibration linear drive unit delivers long-term stable movement for the highest measurement accuracy. This patented dual detector offers single data gathering at nano-level measurement resolution for roughness and contour profiling. The hybrid detector is also available for those interested in upgrading their existing linear surface systems from ZEISS.

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