(Marposs: Auburn Hills, MI) -- Marposs, a world leader in measurement, inspection, and test technologies, has announced the availability of its high-performance STIL MPLS-DM sensor, the newest member of its Chromaline sensors family. This noncontact sensor enables fast, high-resolution gauging of distance, roughness, thickness, and shape of all materials, including transparent and polished mirror surfaces such as glass, plastic or silicon wafers, as well as liquids such as paint film.

The new MPLS-DM provides high quality control and working frequencies up to 2 kHz in standard mode or up to 6 kHz with a reduced range of the sensor. It is offered in five different models with 180 measuring points aligned along a line ranging from 1 mm to 12 mm and minimum measurable thickness capability of 18 µm to 300 µm, depending upon the model. All units measure 448.9 mm x 184 mm x 497 mm (17.6 in. x 7.24 in. x 19.56 in.).

The MPLS-DM synchronizes measurement using an encoder for dynamic acquisitions via Ethernet, with the availability of SDK and protocol commands for easy integration into any system. Based on STIL Chromatic Confocal technology, the MPLS sensor is extremely fast and accurate, making it well-suited for in-line control requirements.

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