The Coordinate Metrology Systems Conference 2005, to be held July 18-22 in Austin, Texas, will present 15 white papers written by metrology experts and scientists from all over the world. The selected white papers cover a wide range of 3-D industrial-measurement applications and topics that cater to the specific interests of manufacturers, engineers, scientists, quality control specialists, metrologists, educators and students.

The event, also sponsored by Quality Digest, includes presentations by metrology specialists from prominent laboratories and leading manufacturers in the world, and a vendor hall showcasing the new trends and technologies in the industry.

Established 21 years ago, the Coordinate Metrology Systems Conference is a five-day event held each year at a different location. It’s renowned for its comprehensive program of white papers and applications presentations given by worldwide industry experts.

To attend the conference, or for more information on the conference program, visit www.cmsc.org.

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