Sypris Test & Measurement recently announced the addition of a field emission scanning electron microscope (SEM) to its destructive physical analysis and failure analysis laboratory.

The new Hitachi 4700 SEM offers high magnification and clearer images, enhancing the laboratory’s already comprehensive abilities in semiconductor analysis, design verification, wafer inspection and surface electroscopy. It features an air-lock chamber to allow the exchange of samples without breaking the vacuum, which helps save time and preserve filaments. It also includes an electron detector for secondary ion and backscattering emissions.

“The new SEM positions Sypris to offer a broader level of analysis services to meet the evolving and challenging demands of our military and aerospace customers,” says Mike McEntee, Sypris Test & Measurement’s division general manager. “The higher resolutions offered by this leading-edge equipment provide the technical answers to the challenging questions posed by our clients.”

For more information, visit www.sypris.com.

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