(NIST: Gaithersburg, MD) -- At the September 2012 International Manufacturing Technology Show (IMTS) in Chicago, the Dimensional Metrology Standards Consortium (DMSC) and eight software vendors will demonstrate standards-based workflow of manufacturing quality data. The emerging standard, Quality Information Framework (QIF), is an XML-based neutral format for quality information that covers the scope of quality measurement plans, measurement results (including ASME Y14.5), measurement rules, measurement resources, and analysis of results (multipart statistics). The DMSC believes that QIF will reduce information processing costs and quality losses from unnecessary measurement information translation, enable seamless exchange of measurement information, facilitate enterprise agility, enable lower product cost, and reduce costs of component integration and maintenance.

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