Ravikiran Attota, a lead researcher in NIST’s Precision Engineering Division, won an R&D 100 Award for his development of through-focus scanning optical microscopy (TSOM), which has applications that cut across a range of industries, from biotechnology to semiconductors and photonics.

(NIST: Gaithersburg, MD) -- A radical new method developed at NIST that transforms the humble, ubiquitous, and inexpensive optical microscope into a powerful 3-D nanoscale and microscale measurement device has won one of this year’s prestigious R&D 100 Awards. The annual awards program recognizes “the 100 most technologically significant products introduced into the market” during the previous year, as selected by an independent judging panel and the editors of R&D Magazine.

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