(National Instruments: Austin, TX) -- National Instruments (NI) has opened registration for the 2011 NI Technical Symposium, a series of daylong events that showcase the latest NI technologies and development techniques for engineers and scientists working with measurement and control systems. The events, which are offered in 24 cities throughout North America from October to December, deliver hands-on training, new product demonstrations, technology exhibitions from National Instruments Alliance Partners, and presentations from NI engineers and industry professionals. The program features a morning keynote and more than a dozen technical sessions designed to help engineers increase productivity, reduce costs, and optimize their systems’ performance.

Highlights from this year’s technical program include hardware-in-the-loop and real-time testing methods, RF vector signal-analysis techniques, best practices for using NI LabVIEW system design software, and tips for optimizing DC measurements for speed and stability.

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