(Olympus) -- Olympus will put its expertise in industrial microscopes, videoscopes, and imaging devices on full display in Booth E-5291 at IMTS 2012 from September 10-15. In-booth talks from a variety of speakers will review topics in non-destructive testing, including visual inspection and motion analysis, as well as the speed of new XRF technologies.

Christopher A. Brown, PhD, PE, FASME, Director of Worcester Polytechnic Institute Surface Metrology Laboratory, will serve as the company’s featured speaker. Chair of ASME B46, Committee for Classification and Designation of Surfaces, he will discuss the identification, measurement, and calculation of surface roughness.

The complete speaker schedule is as follows:

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