(Nikon Metrology: Brighton, MI) -- A pioneering X-ray computed laminography (CL) technique has been introduced by the Industrial Metrology business unit of Nikon for nondestructively inspecting challenging components using the computed tomography (CT) systems it manufactures. The newly available method, called tilted CT, greatly improves voxel resolution when examining flat, high-aspect-ratio components. It also enhances quality control by producing clearer images of samples of any shape in which dense areas can mask those that are less dense.

When scanning flat components that may have a small area of interest in the center that needs to be inspected, conventional 3D CT has limitations in terms of resolution because the axis of rotation of the item under investigation is at 90 degrees to the X-ray beam. It isn’t feasible to position the component closer to the source to increase the magnification of the area of interest and improve resolution because the sample as it turns would collide with the source.

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