(Olympus: Center Valley, Pa.) -- Process engineers, fab managers, professionals in yield enhancement, process development, and failure analysis will benefit from the newly introduced Olympus defect inspection and review system, the company’s fast and accurate semiconductor defect review solution. The fully integrated, cost-effective, semiautomatic tabletop solution employs the latest technology for faster, more accurate stage movement and enhanced optical fidelity, is easy to learn, and is compatible with the most popular defect review file formats.

“We invested the necessary time to bring to market the best possible tabletop system, with load-and-go simplicity, optical excellence, full integration, and faster stage movement,” says Matt Smith, director of industrial microscope sales and marketing for the Olympus America Scientific Equipment Group. “This system is worth waiting for. It incorporates top optical performance with new technology and software developments that allow process control professionals to quickly and efficiently map, record, categorize, image, and analyze defects.”

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