(Keithley: Cleveland) -- Keithley is offering a free webinar on "How to Get the Most From Your Low Current Measurement Instruments," on Nov. 19 at 2 p.m. EST.

This seminar is designed to cover the the basics of low current (from nA to fA) electrical measurements, including how to select the right current measurement instrument, practical ways to reduce current noise in measurement setups, and how to quantify subtle sources of noise.

These measurement best practices are important for applications in semiconductor material/device characterization, nanoscience test and measurement, optoelectronic device characterization, and many more. Application examples where such sensitive measurements are required will be discussed, together with a discussion of recent innovative test equipment solutions.

After attending this seminar, you will understand:

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