Product News: Extended Precision Package for Dynamic InterferometerVerifies optics polishing done by ion-beam etching and MRF
Fri, 08/06/2010 - 12:26
(4D Technology Corp.: Tucson, AZ) -- Extended precision metrology is critical for controlling optics-polishing methods such as ion-beam etching and magnetorheological finishing (MRF). These methods can create features with higher spatial frequency…