Product News: 3-D EMI Scanning Measurement SystemSystem locates source of electromagnetic interference (EMI) noise to a precision of ±0.05 mm
Fri, 08/27/2010 - 09:20
(APREL Laboratories: Napean, ON, Canada) -- APREL Laboratories EM-ISight is a compact, benchtop robotic scanning system that can identify the location of problematic EMI noise sources to a precision of ±0.05 mm. The system allows testing to the…