Bruker and Greening Testing Labs Partner to Provide Benchtop Brake Screening ServicesOffering convenient and cost-effective friction materials testing for automotive industry
Thu, 11/08/2018 - 12:00
(Bruker Nano Surfaces: San Jose, CA and Detroit) -- Bruker Nano Surfaces has announced a partnership with Greening Testing Laboratories of Detroit to provide convenient and cost-effective benchtop friction test and particle-screening capabilities to… Bruker Introduces Nanoscratch Capability for Nanomechanical TestingCharacterizes resistance of thin films and coatings to scratching, cracking, chipping, scuffing, and delamination
Tue, 11/15/2016 - 12:09
(Bruker: San Jose, CA) -- Bruker’s Nano Surfaces Division has released a nanoscale scratch option for its NanoForce Nanomechanical Testing System. The new option brings the low-noise floor, precision, and stability of the NanoForce to controlled… Bruker Introduces Second-Generation Inspire Nanochemical Imaging SolutionFeatures PeakForce IR and IR EasyAlign technology
Thu, 07/09/2015 - 14:33
(Bruker: Santa Barbara, CA) -- Bruker has released its second-generation Inspire infrared (IR) nanocharacterization system, which features 10-nm spatial resolution infrared chemical mapping in an easy-to-use, laser-safe package. With IR EasyAlign,… Multiple, Different Tribology Tests Now Performed on One PlatformBruker’s UMT TriboLab is all about ease of use
Thu, 12/11/2014 - 11:17
(Bruker: Boston) -- At the 2014 MRS Fall Meeting and Exhibit, Bruker announced the release of the UMT TriboLab, the latest generation of the world-leading Universal Mechanical Tester (UMT) platform. TriboLab incorporates into a single, modular… Bruker Introduces New Nanoelectrical Atomic Force Microscopy ModeKelvin Probe Force Microscopy enables quantitative nanoscale surface potential measurements
Tue, 08/14/2012 - 12:50
(Bruker: Santa Barbara, CA) -- Bruker, developer, manufacturer, and provider of scientific instruments and analytical services, has released the new PeakForce Kelvin Probe Force Microscopy (KPFM) mode for its line of atomic force microscopes.… Atomic Force Microscope for Biological DynamicsFirst commercial bio-AFM to capture high-resolution dynamics with ease
Wed, 08/01/2012 - 12:48
(Bruker: Phoenix) -- At the Microscopy & Microanalysis (M&M) 2012 Annual Meeting, Bruker announced the Dimension FastScan Bio Atomic Force Microscope (AFM), which enables high-resolution microscopy research in biological dynamics.… Advanced Handheld XRF Analyzer for Metals Alloy VerificationBrucker introduces the S1 TITAN with SharpBeam technology
Thu, 04/19/2012 - 16:12
(Bruker: Wien, Austria) -- During the 2012 Institute of Scrap Recycling Industries (ISRI) Convention and Exposition held recently in Las Vegas, Bruker, a developer, manufacturer, and provider of scientific instruments and analytical services,… DektakXT Stylus Profiler Offers 40% Faster Scan PerformanceBruker’s tenth-generation system measures nanometer-scale film thickness and surface-textures
Tue, 03/22/2011 - 11:27
(Bruker AXS: Tucson, AZ) -- Bruker has created the DektakXT, a new stylus profiler that is the first production system with sustained repeatability of less than five angstroms. This major milestone in stylus-profiler surface metrology performance… Noncontact Measurement Solution for Shaft Lead AngleReduces warranty costs and enables compliance with environmental regulations
Tue, 02/15/2011 - 14:18
(Bruker Corp.: Tucson, AZ) -- Bruker Corp. has launched the NPFLEX-LA, the first noncontact, 3-D surface metrology system to provide quantitative lead angle and surface-texture measurements for the controlling and reducing fluid leaks of rotary… 3-D Optical Surface Profilers Break Diffraction Limit, Delivering the ImpossibleNew capability enables select surface profilers to deliver unprecedented lateral resolution
Wed, 12/08/2010 - 14:21
(Bruker Corp.: Tucson, AZ) -- At the Materials Research Society (MRS) fall 2010 meeting in late November, Bruker Corp. released AcuityXR, a novel optical surface profiler that combines Bruker hardware and software technology to enable select…
