Poland Develops International Surface Metrology StandardsNew database, SRD 154, includes modified back-scattering factors and will be soon distributed by NIST
Mon, 11/22/2010 - 09:20
(ICHF: Warsaw, Poland) -- Superficial layers of materials, no thicker than several atomic layers, play a key role in many important areas of science and technology, including microelectronics, catalysis, or corrosion science. These surface layers…