Product News: Line-Mountable XRF Yield-Management ToolFilm composition and thickness measurement of CIGS photovoltaic depositions
Mon, 11/30/2009 - 12:35
(Solar Metrology: Halbrook, NY) -- Solar Metrology expands its SMX XRF tool portfolio for film composition and thickness measurement of CIGS photovoltaic depositions with the addition of the System SMX-Remote static head ILH.
Solar Metrology’s…