A CMM with Nanometer Uncertainty for a Micro PriceTriNano offers quick and versatile measurements on small features requiring 3-D nanometer uncertainty
Thu, 10/20/2011 - 16:49
(TriNano: Eindhoven, the Netherlands) -- TriNano is a new nano/micro coordinate measuring machine (CMM) for measuring objects with submillimeter features in 3-D and with nanometer uncertainty. Current micro-CMMs comply with the Abbe principle in 2…