Product News: NPFLEX 3D Metrology System for Characterizing Difficult SurfacesRapid, 3-D surface characterization for large samples
Wed, 09/15/2010 - 12:11
(Veeco Instruments Inc.: Tucson, AZ) -- In booth No. E-5439 at IMTS 2010, Veeco Instruments Inc. will display its NPFLEX 3D Metrology System for characterizing surfaces previously too difficult to measure due to size or part orientation. The… Veeco Sells Metrology Business to Bruker Corp.Company to focus on process equipment for the LED, solar, and data storage markets
Thu, 08/19/2010 - 09:05
(Veeco Instruments Inc.: Plainview, NY) -- Veeco Instruments Inc. has announced that it has agreed to sell its metrology business to Bruker Corp., a provider of high-performance scientific instruments and solutions for molecular and materials… Product News: Optical Surface Profiler for Automated HB-LED ProductionGauge-capable metrology for process quality control
Tue, 07/13/2010 - 13:12
(Veeco: Tucson) -- Veeco Instruments Inc., a global provider of precision instrumentation and metrology solutions, announces a new ContourGT Optical Surface Profiler configuration optimized for characterizing high-brightness, light-emitting diode (… Webinar: Noncontact, 3-D Optical Surface ProfilometryVeeco’s June 15 presentation to focus on ophthalmic manufacturing
Fri, 06/11/2010 - 11:08
(Veeco Instruments Inc.: Plainview, NY) -- As part of its ongoing series of live webinars on 3-D, noncontact surface profilometry, Veeco Instruments Inc. will be hosting a free online seminar on “NonContact, 3-D Optical Surface Profilometry for… New Product: Veeco’s Surface Metrology System3-D Optical Profiler is cost-effective for research and production.
Fri, 05/28/2010 - 09:38
(Veeco Instruments Inc.: Tucson, AZ) -- Veeco Instruments Inc., a global provider of precision instrumentation and metrology solutions for scientific and industrial markets, announced a new low-cost member of its ContourGT family of noncontact, 3-D… Product News: Veeco’s Surface Profilers Have Higher Throughput, CapacityGreatly improves sensitivity and stability and enables precision noncontact 3-D surface metrology in difficult applications
Wed, 04/07/2010 - 12:38
(Veeco Instruments Inc.: Plainview, NY) -- Veeco Instruments Inc. announces the ContourGT surface metrology product family. Veeco’s 10th generation of precision, noncontact, 3-D optical surface profilers delivers up to 10 times the capacity and… Product News: Dimension Edge Atomic Force Microscope SystemVeeco introduces streamlined access to top AFM performance
Wed, 03/10/2010 - 15:20
(Veeco, Plainview, NY) -- Veeco Instruments Inc., a provider of atomic force microscopy (AFM) technology to the nanoscience community, recently announced the Dimension Edge Atomic Force Microscope System for physical and life sciences investigation… Product News: Veeco Introduces the NT9080 Surface Metrology SystemCombines noncontact white light interferometry, ease of use, and affordability for expert- and entry-level precision surface measurements
Tue, 01/26/2010 - 12:01
(Veeco Instruments Inc.: Plainview, NY) -- Veeco Instruments Inc., a provider of scientific and industrial metrology, has introduced the NT9080 Surface Metrology System, which combines noncontact white light interferometry, operator ease of use,… Product News: Optium ADS-800 Series Advanced Dicing System UnveiledVeeco releases precision dicing tool for solar, LED, and optics applications
Mon, 09/14/2009 - 12:24
(Veeco: Plainview, NY) -- Veeco Instruments Inc. announces its Optium ADS-800 Series Advanced Dicing System, delivering high-productivity dicing solutions for a broad range of demanding applications, including high-brightness light emitting… Veeco Sells $5.6 Million in Atomic Force Profilers to Asia
Mon, 11/03/2003 - 22:00
The third quarter of this year has proven lucrative for Veeco Instruments Inc., which has received $5.6 million in orders for its Vx series atomic force profilers from semiconductor customers in Asia and Japan.
The metrology tools, used for in-…
