Content by CMSC
Coordinate Metrology Systems Conference (CMSC) 2013 Brims with 3D Measurement Innovations and InformationCoordinate Metrology Society conducts first Level-One Certification Examination for Metrologists
Mon, 08/05/2013 - 12:36
(CMSC: Benbrook, TX ) -- The Coordinate Metrology Society announced today its 29th annual Coordinate Metrology Systems Conference (CMSC) attracted more than 500 professionals worldwide in the 3D portable measurement and inspection field. CMSC 2013… CMSC 2013 Will Include 3D Metrology Career Fair, USS Midway Museum TourPlus Networking Events, 5 Billion Micron Fun Run/Walk. Begins July 22, 2013, in San Diego
Tue, 07/09/2013 - 11:11
(CMSC: Benbrook, TX) -- The Coordinate Metrology Society (CMS) announced its final schedule of events for the 29th annual Coordinate Metrology Systems Conference (CMSC) from July 22–26, 2013, at the Sheraton San Diego Hotel and Marina in San Diego.… Full House at 29th Annual CMSCGlobal metrology experts fill all 27 presentation slots at Coordinate Metrology Systems Conference
Mon, 06/17/2013 - 11:04
(CMSC: Benbrook, TX) -- The Coordinate Metrology Society (CMS) has filled all 27 speaker slots at the 2013 Coordinate Metrology Systems Conference (CMSC) scheduled for July 22–26, 2013, at the Sheraton San Diego Hotel and Marina in San Diego,… Coordinate Metrology Society Launches Level-One Certification for Portable 3D Metrology First examinations to be held at CMSC 2013
Mon, 04/22/2013 - 10:39
(CMSC: San Diego, CA) --The Coordinate Metrology Society (CMS), the preeminent membership association for measurement professionals, has announced the launch of the industry’s first Level-One Certification for Portable 3D Metrology. The first… Level-One Certification for 3D Portable Metrology Offered During CMSC 2013
Wed, 02/13/2013 - 15:15
(CMSC: San Diego CA) -- The Coordinate Metrology Society (CMS), the eminent membership association for measurement professionals, is hosting the 29th annual Coordinate Metrology Systems Conference (CMSC) on July 22–26, 2013 at the Sheraton San Diego… Coordinate Metrology Society Announces Call for Papers for CMSC 2013Deadline for abstracts is March 15, 2013
Fri, 11/30/2012 - 13:49
(CMS: Benbrook, TX) -- The Coordinate Metrology Society (CMS) has announced its call for papers is now open for the 29th annual Coordinate Metrology Systems Conference (CMSC), to be held July 22–26, 2013, in San Diego, California. The CMS is the… Find a Job in the Metrology FieldVisit the CMSC Careers Fair on July 19, 2012
Tue, 06/26/2012 - 12:33
(CMSC: Benbrook, TX) -- The Coordinate Metrology Society (CMS), the eminent membership association for industrial measurement professionals, is hosting the first CMSC Metrology Careers Fair on Thursday, July 19, 2012, from 10 a.m.–11:30 a.m., during… Coordinate Metrology Society to Host Third Measurement Study at CMSC 2012 Also the 5 Billion Micron Fun Run/Walk and bone marrow registry drive
Fri, 06/15/2012 - 15:47
(CMSC: Benbrook, TX) -- The Coordinate Metrology Society (CMS), the eminent membership association for measurement professionals, is hosting its third large-scale, interactive measurement study, as well as two other events at the 28th annual… CMSC 2012 Showcases 27 Technical Presentations from Metrology Experts Around the Globe3-D measurement and inspection professionals share knowledge of technology solutions
Mon, 05/07/2012 - 11:09
(CMSC: Benbrook, TX) -- The Coordinate Metrology Society (CMS) has announced that 27 technical presentations are scheduled for its annual Coordinate Metrology Systems Conference (CMSC) from July 16–20, 2012, at The Roosevelt Hotel in New Orleans.… Coordinate Metrology Society to Conduct Pilot Metrology Certification Examinations Membership to test knowledge of portable 3-D Metrology at the 2012 Coordinate Metrology Systems Conference
Tue, 04/17/2012 - 12:50
(CMSC: New Orleans, LA) -- The Coordinate Metrology Society (CMS), the preeminent membership association for measurement professionals, will host a series of “pilot” certification examinations at its 28th annual Coordinate Metrology Systems…
