(Veeco: Tucson) -- Veeco Instruments Inc., a global provider of precision instrumentation and metrology solutions, announces a new ContourGT Optical Surface Profiler configuration optimized for characterizing high-brightness, light-emitting diode (HB-LED) patterned sapphire substrates (PSS). The ContourGT-X8 PSS combines advanced noncontact 3-D measurement capabilities with unique Veeco PSS metrology hardware and software technology, and a Wafer Automation System Developer’s Kit (SDK) that provides a tailored solution for PSS quality assurance and quality control applications where high-throughput and repeatability capabilities are essential.

 …