(ICHF: Warsaw, Poland) --  Superficial layers of materials, no thicker than several atomic layers, play a key role in many important areas of science and technology, including microelectronics, catalysis, or corrosion science. These surface layers are being studied with different surface-sensitive techniques, in particular with electron spectroscopes. However, quantitative surface analysis by spectroscopic methods requires taking into consideration certain parameters that are only available in the databases distributed by the U.S. National Institute of Standards and Technology (NIST). Several of these databases are being developed by Aleksander Jabłoński from the Institute of Physical Chemistry of the Polish Academy of Sciences. The coming release of the latest of these databases coincides with honoring Jabłoński’s achievements with the Maria Skłodowska-Curie Scientific Award that is awarded by the Polish Academy of Sciences (PAS).

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