(Solar Metrology: Halbrook, NY) -- Solar Metrology expands its SMX XRF tool portfolio for film composition and thickness measurement of CIGS photovoltaic depositions with the addition of the System SMX-Remote static head ILH.

Solar Metrology’s System SMX-ILH is an atmospheric in-line X-ray fluorescence (XRF) metrology tool platform that provides composition and thickness measurements for thin film solar PV metal film stacks on flexible roll-to-roll substrates such as stainless steel, aluminum, and polyimide, or rigid substrates such as float glass.

SMX-ILH is designed to perform measurements in an atmospheric environment, either near-line or in-line. Remote SMX-ILH tool platform models are designed to measure in either one static location or across the gradient (points on a linear line perpendicular to movement) of flexible or rigid glass substrates. Typical measurement applications include Mo thickness and all CIGS combinations (including all CIG alloys and film combinations, and final CIGS formulations).

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