Using Atomic Force Microscopy With a Scanning Electron MicroscopeZeiss’ AFM option for its MERLIN series helps characterize nanostructures
Wed, 10/02/2013 - 12:20
The AFM Option for the ZEISS MERLIN series combines a high-end, atomic force microscope (AFM) with a scanning electron microscope (SEM) to produce in situ, high-resolution AFM measurements in the SEM. The combination opens up new possibilities for…