{domain:"www.qualitydigest.com",server:"169.47.211.87"} Skip to main content

        
User account menu
Main navigation
  • Topics
    • Customer Care
    • FDA Compliance
    • Healthcare
    • Innovation
    • Lean
    • Management
    • Metrology
    • Operations
    • Risk Management
    • Roadshow
    • Six Sigma
    • Standards
    • Statistics
    • Supply Chain
    • Sustainability
    • Training
  • Videos/Webinars
    • All videos
    • Product Demos
    • Webinars
  • Advertise
    • Advertise
    • Submit B2B Press Release
    • Write for us
  • Metrology Hub
  • Training
  • Subscribe
  • Log in
Mobile Menu
  • Home
  • Topics
    • 3D Metrology-CMSC
    • Customer Care
    • FDA Compliance
    • Healthcare
    • Innovation
    • Lean
    • Management
    • Metrology
    • Operations
    • Risk Management
    • Six Sigma
    • Standards
    • Statistics
    • Supply Chain
    • Sustainability
    • Training
  • Login / Subscribe
  • More...
    • All Features
    • All News
    • All Videos
    • Contact
    • Training
Content by NIST
New Reference Material Helps Get Lead Out of Paints for Children’s ProductsSRM 2569 can be used to check lead levels against industry regulations
Wed, 10/17/2012 - 11:16
To help manufacturers adhere to new regulations intended to reduce the risk of lead poisoning in children, researchers at the National Institute of Standards and Technology (NIST) have developed standard test samples of lead paint films of the sort…
Home Sweet Lab NIST has prototyped a computerized house that generates as much energy as it uses
Fri, 09/14/2012 - 13:56
During a recent ribbon-cutting ceremony, the U.S. Commerce Department’s National Institute of Standards and Technology (NIST) unveiled a new laboratory designed to demonstrate that a typical suburban home for a family of four can generate as much…
NIST ‘Hybrid Metrology’ Method Could Improve Computer ChipsScientists have devised a precise, less expensive method of measuring what sits on a chip
Wed, 09/12/2012 - 14:20
A refined method developed at the National Institute of Standards and Technology (NIST) for measuring nanometer-sized objects may help computer manufacturers more effectively size up the myriad tiny switches packed onto chips’ surfaces. The method,…
New Measurement Capabilities Advance Fire PreventionNIST strategic road map aims to reduce U.S. fire burden by one-third
Wed, 09/12/2012 - 12:19
The United States already has one of the highest direct fire loss rates among developed nations, and progress in reducing this tremendous burden is slowing. Fires claim more than 3,000 lives a year, injure more than 90,000 firefighters and…
PML Goes to Mars: Far-Out Thermal CalibrationSensors help turn radioactive plutonium into power
Tue, 09/11/2012 - 12:27
Sometimes the chain of measurement traceability—the unbroken series of links between a calibrated instrument and the official NIST standard—can get pretty long. But 250 million kilometers is remarkable, even for the National Institute of Standards…
Excellence by the DozenTwelve organizations vie for 2012 Baldrige Award
Wed, 09/05/2012 - 11:37
Twelve U.S. organizations have reached the next step on the road to possibly achieving a silver anniversary Malcolm Baldrige National Quality Award. The Baldrige Award is the nation’s highest recognition for organizational performance excellence.…
NIST Announces 12 Small Business Innovation Research AwardsCompetitive funding program encourages companies to commercialize new technologies
Tue, 09/04/2012 - 12:47
The National Institute of Standards and Technology (NIST) has announced nearly $2 million in Phase I and Phase II Small Business Innovation Research (SBIR) awards to 12 U.S. businesses. These awards provide funding to help companies develop…
Baldrige Celebrates Its 25th AnniversaryHonoring its past while building an even better future
Tue, 08/21/2012 - 11:32
(NIST: Gaithersburg, MD) -- The Baldrige Performance Excellence Program is building an even better future as a national steward of validated management practices; even better operations, systems, and processes for the thousands of organizations that…
Dimensional Metrology Standards Consortium to Demo New StandardNearing completion, the QIF standard will reduce information processing costs and quality losses
Thu, 08/16/2012 - 16:14
(NIST: Gaithersburg, MD) -- At the September 2012 International Manufacturing Technology Show (IMTS) in Chicago, the Dimensional Metrology Standards Consortium (DMSC) and eight software vendors will demonstrate standards-based workflow of…
Shelling Out EvidenceNIST ballistic standard helps tie guns to criminals
Thu, 08/09/2012 - 10:48
Thanks to a new reference standard developed by the National Institute of Standards and Technology (NIST), law enforcement agencies will have an easier time linking the nearly 200,000 cartridge cases recovered annually at U.S. crime scenes to…

Pagination

  • First page « First
  • Previous page ‹ Previous
  • …
  • Page 23
  • Page 24
  • Page 25
  • Page 26
  • Current page 27
  • Page 28
  • Page 29
  • Page 30
  • Page 31
  • …
  • Next page Next ›
  • Last page Last »

© 2025 Quality Digest. Copyright on content held by Quality Digest or by individual authors. Contact Quality Digest for reprint information.
“Quality Digest" is a trademark owned by Quality Circle Institute Inc.

footer
  • Home
  • Print QD: 1995-2008
  • Print QD: 2008-2009
  • Videos
  • Privacy Policy
  • Write for us
footer second menu
  • Subscribe to Quality Digest
  • About Us
  • Contact Us