Content by NIST
Nanoscale Magnetic Media Diagnostics Using Rippling Spin WavesDetects defects in magnetic structures as small as 0.1 micron
Tue, 04/03/2012 - 14:59
Memory devices based on magnetism are one of the core technologies of the computing industry, and engineers are working to develop new forms of magnetic memory that are faster, smaller, and more energy efficient than today’s flash and SDRAM memory.… Baldrige’s Transition to a Sustainable, Enterprise ModelNational quality program is transitioning away from federal funding
Tue, 03/27/2012 - 13:07
(NIST: Gaithersburg, MD) -- A self-sustaining business model based on income generation, and supplemented with support from the Foundation for the Malcolm Baldrige National Quality Award and other nonoperating income, is the new environment for the… NIST April Workshop to Examine Federal Conformity Assessment PracticesWed. April 11, 2012, in Gaithersburg, MD
Thu, 03/22/2012 - 12:30
(NIST: Gaithersburg, MD) -- The National Institute of Standards and Technology (NIST) is hosting a free public workshop on best practices in federal conformity-assessment activities Wed., April 11, 2012, at NIST’s Gaithersburg, Maryland, site.… Nanopower: Avoiding Electrolyte Failure in Nanoscale Lithium BatteriesSize of electrolytes affects battery performance, say NIST researchers
Wed, 03/21/2012 - 11:11
It turns out you can be too thin—especially if you’re a nanoscale battery. Researchers from the National Institute of Standards and Technology (NIST); the University of Maryland, College Park; and Sandia National Laboratories built a series of… NIST Measurements May Help Optimize Organic Solar CellsCost less to produce than conventional cells, cover larger areas, and recycle more easily
Mon, 03/12/2012 - 10:22
Organic solar cells may be a step closer to market because of measurements taken at the National Institute of Standards and Technology (NIST) and the U.S. Naval Research Laboratory (NRL), where a team of scientists has developed a better fundamental… Baldrige Award Ceremony is Bonus for Attendees at Quest for ExcellenceAn invitation to attend the ceremony/reception for 2010 and 2011 Baldrige Award recipients
Fri, 03/09/2012 - 12:38
(NIST: Gaithersburg, MD) -- Register for the 24th annual Quest for Excellence conference and you’ll get something extra: an invitation to attend the ceremony and reception honoring the 2010 and 2011 recipients of the Malcolm Baldrige National… Experts Recommend Measures to Reduce Human Error in Fingerprint AnalysisIncluding prerequisite skills, training, testing, certification of examiners
Wed, 02/29/2012 - 11:53
A new report by the National Institute of Standards and Technology (NIST) and the Department of Justice’s National Institute of Justice (NIJ) has documented 149 potential sources of human error in the analysis of crime scene fingerprints. The study… Celebrate Legal Metrology During Weights and Measures Week 2012Recognizing the importance of accuracy
Tue, 02/28/2012 - 11:19
Weights and measures are indispensable. From the grocery store to the gas pump, all kinds of consumer products are sold by some measurable quantity, whether it’s length, count, volume, or weight. These values, the machines that measure them, and the… NIST 2013 Budget Targets Advanced Manufacturing, Science, and Tech ProgramsThe proposed $857 million is up $106 million from 2012 budget
Tue, 02/14/2012 - 12:17
(NIST: Washington) -- President Obama’s fiscal year (FY) 2013 budget for the Department of Commerce’s National Institute of Standards and Technology (NIST) submitted to Congress proposes an appropriations funding level of $857 million, an increase… NIST ‘Cell Assay on a Chip’Solid results from simple means
Wed, 02/08/2012 - 11:43
The great artist and inventor Leonardo da Vinci once said, “Simplicity is the ultimate sophistication.” National Institute of Standards and Technology (NIST) research engineer Javier Atencia certainly believes in the wisdom of what da Vinci preached…
