Content by Quality Digest
Fuji and Cogiscan Announce Their Collaboration
Mon, 03/13/2006 - 22:00
In a strategic partnership, Fuji Machine Manufacturing Co. and Cogiscan will develop and market a new RFID technology for Fuji machines. The companies jointly developed the RFID Smart Reader kit for Fuji’s XP-series machines. The kit will… Shingo Prize Winners Announced
Mon, 03/13/2006 - 22:00
Ten very different organizations recently received The Shingo Prize for Excellence in Manufacturing. The prize, which has been dubbed the Nobel Prize of manufacturing, recognizes organizations’ quality and efficiency achievements using… Leica Geosystems to Showcase CMM at WESTEC
Mon, 03/13/2006 - 22:00
Leica Geosystems’ Metrology Division will showcase its Universal CMM product line at the upcoming WESTEC show in Los Angeles. The Universal CMM consists of a Leica Laser Tracker combined with the Leica T-Scan and/or the Leica T-Probe II.… Renishaw Offers Trade-In On Laser Calibration Upgrades
Wed, 03/08/2006 - 22:00
Renishaw recently started offering a special trade-in program for users of older Hewlett Packard HP5528 and HP5529 laser systems. The company will provide trade-in allowances when users upgrade to Renishaw’s ML10 Gold Standard laser… YESTech Receives Service Excellence Award
Wed, 03/08/2006 - 22:00
YESTech Inc., a supplier of automation-inspection and yield-enhancement systems for the electronics industry, recently received the Service Excellence Award from Circuits Assembly magazine. The award recognizes companies that receive the highest… Metrology Interoperability Summit Approaches
Wed, 03/08/2006 - 22:00
Hundreds of metrology professionals are expected to attend the International Metrology Interoperability Summit, March 28–30 in Gaithersburg, Maryland. The goal of the event is to define a unified “technology roadmap” for dimensional… CMSC Accepting Presentation Proposals
Wed, 03/08/2006 - 22:00
Planners of the upcoming Coordinate Metrology Systems Conference are accepting papers for possible presentation during the event. The conference will be held July 17–21 at the Doubletree Hotel in Orlando, Florida. Metrology specialists from… Department of Commerce Issues a Standard for ID Cards
Tue, 03/07/2006 - 22:00
The National Institute of Standards and Technology, a part of the Department of Commerce, recently issued the final specifications for Personal Identity Verification (PIV) cards. The cards will be required of all federal employees and… RABQSA Announces Laboratory Assessor Accreditation
Tue, 03/07/2006 - 22:00
RABQSA and the Canadian Association for Environmental Analytical Laboratories (CAEAL) recently established an industry-specific laboratory accreditation scheme for Canadian assessors. The scheme provides recognition to assessors who provide… ISO Guideline Addresses Business Records Management
Tue, 03/07/2006 - 22:00
Are you wondering what to do with the boxes of spreadsheets, forecast plans and financial documents stored in your office? Just ask the International Organization for Standardization, which recently published a new guideline for business-…
