Company News: Nikon Metrology, Verisurf Team UpPartnership offers single software platform for Nikon metrology devices
Mon, 07/19/2010 - 15:01
(Nikon Metrology: Brighton, MI) -- Nikon Metrology and Verisurf Software have joined forces to make it possible for manufacturers to drive all Nikon Metrology portable metrology devices from Verisurf’s common software platform. Supported Nikon… Company News: Nikon Metrology, Verisurf Team UpPartnership offers single software platform for Nikon metrology devices
Mon, 07/19/2010 - 15:01
(Nikon Metrology: Brighton, MI) -- Nikon Metrology and Verisurf Software have joined forces to make it possible for manufacturers to drive all Nikon Metrology portable metrology devices from Verisurf’s common software platform. Supported Nikon… Product News: Optelics H1200 Confocal Microscope Available in North AmericaNikon to distribute the system in the United States and Canada
Fri, 07/16/2010 - 12:31
(Nikon Metrology: Brighton, MI) -- Nikon Metrology Inc. will distribute Lasertec’s Optelics H1200, a real color confocal microscope with unprecedented color separation and high resolution. The two companies have agreed that Nikon will distribute… Product News: Confocal NEXIV VMZ-K6555 Provides Longer XY TravelFast, accurate noncontact 3-D measurement for large stage-travel applications
Wed, 07/14/2010 - 11:58
(Nikon Metrology: Brighton, MI) -- Nikon Metrology Inc. introduces the Confocal NEXIV-K6555 with advanced confocal metrology capabilities that provide new measurement possibilities for demanding applications. The Confocal NEXIV-K6555 incorporates… Product News: Nikon’s Eclipse L300N/L300ND Widens Inspection CapabilityEnhanced epi-fluorescence improves observation performance and operation
Wed, 07/14/2010 - 05:30
(Nikon Metrology: Brighton, MI) -- Nikon Metrology Inc. introduces the Eclipse L300N/L300ND, an FPD/LSI inspection microscope with an enhanced epi-fluorescence function enabling 365 nm UV excitation, optimal for inspecting semiconductor resist… Product News: Nikon Hand-Held Scanning Solution With MCA II Articulated ArmMeasurement volumes between 1.8 and 3.6 meters and accuracy to 16 microns
Wed, 05/26/2010 - 15:18
(Nikon Metrology: Brighton, MI) -- At Eastec 2010, happening May 25–27, Nikon Metrology Inc. will introduce the new MCA II range of articulated arms with a measurement volume between 1.8 and 3.6 meters diameter. Equipped with the brand new… Nikon Forms Nikon Metrology Inc. for Industrial-Based Metrology CustomersFormer Metris business is combined with Nikon Industrial Instruments.
Fri, 05/21/2010 - 07:28
(Nikon Metrology Inc.: Brighton, MI) -- Nikon has formed Nikon Metrology Inc., a new company that combines Nikon Instruments Inc.’s industrial instruments business with the former Metris business, acquired by Nikon Corp. in 2009. Nikon Metrology… Product News: CMM Laser Scanning Within Accuracy of Tactile MeasurementHigher scanning rate captures surfaces of varying color and high reflectivity without user interaction.
Tue, 05/18/2010 - 09:41
(Nikon Metrology: Leuven, Belgium) -- At the international 2010 Control trade fair for quality assurance, Nikon Metrology introduced the all-digital LC60Dx/LC50Cx scanners. The next-generation LC60Dx CMM laser scanner, evolved from the successful… Rapid Prototyping Using Nikon Metrology Scanner and PolyWorks Software3-D scanning and point cloud-based inspection on the wing of the Boeing 787 Dreamliner
Thu, 04/22/2010 - 12:29
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few years ago a Missouri-based casting company, O’Fallon Casting, realized that its touch probe-based inspection system was stretched to the limit for most of its rapid prototyping work. O’Fallon Casting took a new approach by installing a… Company News: Metris USA Changes Its Name to Nikon Metrology Inc.Blends Metris’ innovation with the globally recognized Nikon brand
Tue, 01/05/2010 - 17:26
(Nikon Metrology Inc.: Brighton, MI) -- Following the announcement in late October of Metris becoming a wholly-owned subsidiary of Nikon Corp. (and a name change to Nikon Metrology NV in Europe), the corporate name of Metris USA has now changed to…
