Call for National Voluntary Consensus Standards for Health Care IT
Thu, 01/10/2008 - 22:00
(NQF: Washington, D.C.) -- National Quality Forum is formally soliciting candidate measures for review and evaluation for potential inclusion in its set of NQF-endorsed voluntary consensus standards for health care information technology (HIT… Senators Foster E-Prescriptions
Thu, 01/10/2008 - 22:00
(U.S. Senate: Washington, D.C.) -- The cost of poor quality in health care accounts for from 30 to 60 cents of every health care dollar. Senators John Kerry (D-Mass.) and John Ensign (R-Nev.) along with a bipartisan group of legislators have… CIGNA HealthCare Teams with Thomson’s MedStat Data Services
Thu, 01/10/2008 - 22:00
(CIGNA HealthCare: Bloomfield, Connecticut) -- In an effort to manage the high-volume data used in its health advocacy programs, CIGNA HealthCare is teaming up with Thomson Healthcare’s MedStat data services. By employing greater data… USGBC and GGHC Working to Green Health Care
Thu, 01/10/2008 - 22:00
(USGBC: Washington, D.C.) -- The U.S. Green Building Council and the Green Guide for Health Care have agreed to help green the health care industry by fostering best practices and ensuring that the health care industry has the tools and… 2007 Malcolm Baldrige National Quality Award Winner Mercy Health System
Thu, 01/10/2008 - 22:00
(Mercy Health System: Janesville, Wisconsin) -- Mercy Health System, a recipient of the 2007 Malcolm Baldrige National Quality Award, is recognized for organizational excellence across its entire vertically integrated organization spanning… WCBF Seventh Annual Six Sigma and Process Improvement in Healthcare Summit
Thu, 01/10/2008 - 22:00
(WCBF: Las Vegas) -- WCBF will host the Seventh Annual Six Sigma and Process Improvement in Healthcare Summit in Las Vegas, April 1–4, 2008. The focus will be on lean, Six Sigma, and other process improvement methodologies within the health care… Development Program for Sub-32nm Metrology
Wed, 01/09/2008 - 22:00
Metryx Ltd., a supplier of mass metrology equipment to the semiconductor manufacturing industry, has announced that it has entered into a joint development program with Interuniversity MicroElectronics Center (IMEC ) of Belgium, a leading… A New Approach to Surface Profiling
Wed, 01/09/2008 - 22:00
The four images (taken with scanning laser confocal microscopy) show variations in surface roughness of an aluminum alloy as produced by increasing amounts of strain: A – 1 percent, B – 4 percent, C – 8 percent and D – 12… Guide to Friction, Wear, Erosion Testing
Wed, 01/09/2008 - 22:00
(ASTM International: West Conshohocken, Pennsylvania) -- Manual 56, Guide to Friction, Wear and Erosion Testing is now available from ASTM International. The manual, authored by Kenneth G. Budinski, is a resource for newcomers to tribology,… Jacques Régis assumes Presidency of the International Electrotechnical Commission
Tue, 01/08/2008 - 22:00
(Standards Council of Canada: Ottawa) -- The Standards Council of Canada has announced that Jacques Régis has began his three-year term as president of the International Electrotechnical Commission. Régis, who becomes IEC’s 32nd president and…
