Company finds multiple uses to field validation requirements
Comprehensive two-day seminar explores test methods and offers practical tips for test selection
Company adds X-ray fluorescence analytical instruments to its portifolio
Learn the plane’s construction and the manufacturing technology behind it.
Four comprehensive metrology and 3-D imaging presentations
SmartScope ZIP Lite 250 and 300 combine video-based inspection with motorized zoom optics.
Automatic operation provides fast, high-precision, nanometer (nm) range measurements
X-Orbit, ScanTec, MobileScan3D, and Shapetracer make their North American debut
The first industrial grade, high-performance thermal imager
Event to take place on Friday, Nov. 5, at the company’s global headquarters in Lake Mary, Florida.
Helps metrologists overcome problems from shadows in the laser line
Optical comparator employs completely telecentric optics, which yield upright and reversed images.
A versatile unit that measures light sources accurately
The microscopy system aids in measurement for industrial and quality applications.
A range of capacities is available to address applications in every industry.
JAI’s camera provides simultaneous separate imaging of R,G,B, plus NIR light.
Allows configuration and multifunction calibration in hazardous areas
Training classes, parts, and accessories now available through e-commerce.
Simplifies inspection of hard-to-hold parts
Program will include the new DMIS 5.2 as well as the I++DME specification.
