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Nikon’s APDIS Laser Radar Awarded Global Product Leadership Recognition
Recognized for advancing high-precision, in-line dimensional inspection, data-driven manufacturing in automotive production
Updates to ZEISS PiWeb Help Manufacturers Reduce Quality Silos
Expanded automated workflows, advanced analytics, and new integration with SF&G data
LK Metrology Presents New Products at IMTS 2026
ISF shop-floor CMMs, Blue Laser CMM scanners, PXR CT system, and related CMM accessories
Pulse of Quality in Manufacturing 2026 Survey Reveals Surge in AI Adoption
Also reveals strategic investment in quality as recalls, tariff uncertainty, and labor shortages intensify
Park Systems Launches Park FX40 IR
Uniting full AFM performance and nanoscale IR spectroscopy in a single automated platform
Hexagon Boosts Large-Volume Inspection Productivity
Integrates contact probing and laser scanning
Nikon Launches ECLIPSE LV100AMS
New one-click automated microscope
SCANOLOGY Launches AccuArm Portable CMM
Reaching deeper, measuring smarter
Teledyne Expands AxCIS Contact Image Sensor Family
New 1,800 dpi and 1,500 mm models
SignalFire Launches AirQ Scout-LCD
The future of wireless gas emissions monitoring
New Auto-Match System From BYK-Gardner USA
Color matching and data analysis for retail store management
Nikon NEXIV VMF-K6561 Achieves Full 600 mm Panel Coverage
Eliminates production backlogs and shortens measurement times
Highly Sensitive Inline Leak Testing of Individual MAP Packages at High Speed
LEAK-MASTER ONE checks products individually for leaks
FARO CREAFORM Redefines Industry Standards With HandySCAN 3D EVO Series
Metrology-grade accuracy provides an unmatched user experience on an evolving platform
NewTek Introduces Free Online LVDT Resource
FAQs for engineers and integrators
Wear and Tear Changes Measurable PFAS Levels in Firefighter Hoods, Gloves, and Wildland Gear
Exposure to PFAS, also known as “forever chemicals,” has been linked to negative health outcomes
InnovMetric Launches PolyWorks 2026
Elevating 3D measurement with cloud technology, AI, and universal compatibility
Uviquity Announces World’s First Chip-Scale Deep-UV Laser
For analytical and inspection instruments
Teledyne e2v Introduces Compact Imaging Solution for Low-Light Imaging
Caiman provides high sensitivity in low-light conditions—less than 1 mlx
Hexagon Manufacturing Intelligence Launches PC-DMIS FUSION
Modernizing metrology reporting and analytics

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