TriNano offers quick and versatile measurements on small features requiring 3-D nanometer uncertainty
Applications include color processing, cell identification, and quality assurance
Free event Thurs., Oct. 27, 2011, from 11:30–12 p.m.
Held in 24 cities throughout North America from October to December
Handheld EDXRF spectrometer offers speed, accuracy, ease of use
Oct. 24–25, 2011, in Worcester, Massachusetts
Doubles effective measuring range at a given tolerance, compared to typical CMMs
A breakthrough in noncontact comparative measuring technology
High precision, compact, bridge-type CMM features offers 0.9 micron + L/400 accuracy
An open software tool for industrial vision
Falcon2 series delivers fast frame rates, true global shutter operation
The better the lighting, the better to see the part or mark
Comment on FARO’s message board beginning Oct. 20, 2011, and the company will donate $5
Self-contained laser displacement using 1,024 pixel CMOS linear imager
Standard’s focus is on device discovery, device control, event handling, and streaming data
For characterizing thermal conditions in electronic systems
Designed to support single-axis and triaxial measurement requirements
For technicians performing ultrasonic flaw detection and X-ray fluorescence inspections
Portable verification for instrumentation settings and cable integrity
For use in critical sample positioning or beam management processes in vacuum environments
